Dr. Nikolaos Papadopoulos, and Dr. Maria Georgiou. “Comprehensive Modeling and Analysis of Front- and Back-Gated 6 nm HEMTs Utilizing High-K Dielectric Layers”. International Research Journal of Computer and Electronics Engineering 11, no. 1 (April 29, 2024): 22–28. Accessed October 21, 2026. https://urgcee.org/index.php/ircee/article/view/96.