Dr. Nikolaos Papadopoulos, and Dr. Maria Georgiou. “Comprehensive Modeling and Analysis of Front- and Back-Gated 6 nm HEMTs Utilizing High-K Dielectric Layers”. International Research Journal of Computer and Electronics Engineering, vol. 11, no. 1, Apr. 2024, pp. 22-28, https://urgcee.org/index.php/ircee/article/view/96.