DR. HARUTO YAMAZAKI; DR. PRIYA SHARMA. Analysis of Thermal Behavior in FinFET Devices Considering Channel Fin Width and Operating Voltage. International Research Journal of Computer and Electronics Engineering, [S. l.], v. 8, n. 1, p. 24–31, 2021. Disponível em: https://urgcee.org/index.php/ircee/article/view/57. Acesso em: 21 oct. 2026.